Translation and analysis of words by ChatGPT artificial intelligence
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Fermat's test for primeness - translation to russian
![British mathematician [[Andrew Wiles]].](https://commons.wikimedia.org/wiki/Special:FilePath/Andrew wiles1-3.jpg?width=200 "British mathematician [[Andrew Wiles]].")
![Problem II.8 in the 1621 edition of the ''Arithmetica'' of [[Diophantus]]. On the right is the margin that was too small to contain Fermat's alleged proof of his "last theorem".](https://commons.wikimedia.org/wiki/Special:FilePath/Diophantus-II-8.jpg?width=200 "Problem II.8 in the 1621 edition of the ''Arithmetica'' of [[Diophantus]]. On the right is the margin that was too small to contain Fermat's alleged proof of his \"last theorem\".")
![Fermat's [[infinite descent]] for Fermat's Last Theorem case n=4 in the 1670 edition of the ''Arithmetica'' of [[Diophantus]] (pp. 338–339).](https://commons.wikimedia.org/wiki/Special:FilePath/Diophantus-VI-24-20-Fermat.png?width=200 "Fermat's [[infinite descent]] for Fermat's Last Theorem case n=4 in the 1670 edition of the ''Arithmetica'' of [[Diophantus]] (pp. 338–339).")
![Ukrainian copyright certificate for a "proof" of Fermat's Last Theorem](https://commons.wikimedia.org/wiki/Special:FilePath/Fermat Last Theorem "proof" registered by Ukraine officials.jpg?width=200 "Ukrainian copyright certificate for a \"proof\" of Fermat's Last Theorem")
Definition
Wikipedia
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure.
In other words, the response of vectors (patterns) from a good circuit is compared with the response of vectors (using the same patterns) from a DUT (device under test). If the response is the same or matches, the circuit is good. Otherwise, the circuit is not manufactured as it was intended.
DFT plays an important role in the development of test programs and as an interface for test application and diagnostics. Automatic test pattern generation, or ATPG, is much easier if appropriate DFT rules and suggestions have been implemented.
